MPG-Logo

Publications

    << < 687 688 689 690 691 692 693 > >>

    Search response: 8247 publications match your query. Listing starts with latest publication first: (6891 - 6900)

    MPP-2006-212 ATLAS SCT end-cap module production, The ATLAS SCT Collaboration, A. Abdesselam et al., (Full text), inSPIRE entry.
    [ATLAS], [Article]
    MPP-2006-211 The barrel modules of the ATLAS semiconductor tracker., The ATLAS SCT Collaboration, A.Abdesselam et al., (Full text), Nucl.Instrum.Meth.A 568 (2006) 642-671.
    [ATLAS], [Article]
    MPP-2006-210 Development of DEPFET Macropixel detectors, C. Zhang, P. Lechner, G. Lutz, M. Porro, et al., (Full text), Nucl.Instrum.Meth.A 568 (2006) 207-216.
    [Semiconductor Detectors], [Conference-Paper]
    MPP-2006-209 Study of noise and spectroscopic performance of DEPMOSFET matrix prototypes for XEUS, J. Treis, P. Fischer, O. Hälker, M. Harter, et al., (Full text), Nucl.Instrum.Meth.A 568 (2006) 191-200.
    [Semiconductor Detectors], [Conference-Paper]
    MPP-2006-208 Clear-performance of linear DEPFET devices, C. Sandow, L. Andricek, P. Fischer, R. Kohrs, et al., (Full text), Nucl.Instrum.Meth.A 568 (2006) 176-180.
    [Semiconductor Detectors], [Conference-Paper]
    MPP-2006-207 Performance of a DEPFET pixel system for particle detection, M. Trimpl, L. Andricek, P. Fischer, R. Kohrs, et al., (Full text), Nucl.Instrum.Meth.A 568 (2006) 201-206.
    [Semiconductor Detectors], [Conference-Paper]
    MPP-2006-206 DEPFET sensor design using an experimental 3d device simulator, K. Gärtner, R. H. Richter, (Full text), Nucl.Instrum.Meth.A 568 (2006) 12-17.
    [Semiconductor Detectors], [Conference-Paper]
    MPP-2006-205 Advancements in DEPMOSFET device developments for XEUS, J.Treis, L. Bombelli, R. Eckhart, C. Fiorini, et al., (Full text), Proc.SPIE 6276, High Energy, Optical and Infrared Detectors for Astronomy II (2006) .
    [Semiconductor Detectors], [Conference-Paper]
    MPP-2006-204 Analysis of the charge collection process in pn CCDs, N. Kimmel, R. Hartmann, P. Holl, N. Meidinger, R. H. Richter, L. Strüder, (Full text), Proc.SPIE 6276 (2006) 62760D, (External full text link).
    [Semiconductor Detectors], [Conference-Paper]
    MPP-2006-203 Sub-electron noise measurement on repetitive non-destructive readout devices, S. Wölfel, S. Herrmann, P. Lechner, G. Lutz, et al., (Full text), Nucl.Instrum.Meth.A 566 (2006) 536-539.
    [Semiconductor Detectors], [Conference-Paper]

Print